FT-371系列高阻双电四探针测试仪
FT-371 Series Ultra high resistance double electric four-probe tester
一.概述Overview：
四探针法测试高阻值材料方阻及电阻率，可以测试到1010Ω方阻值，液晶显示， AD芯片控制，恒流输出， 四探针双位测量、参考美国 A.S.T.M 标准。中或英文语言版本.
The four probe method tests the resistance and resistivity of the high resistance material . It can test to1010Ω resistance value. Liquid crystal display. high precision AD chip control. constant current output. Four probe double bits measurement.
Refer to the American A.S.T.M. standard.Chinese or English language versions.
二.适用范围：
覆盖膜;导电高分子膜，高、低温电热膜;隔热、导电窗膜 导电(屏蔽)布、装饰膜、装饰纸;金属化标签、合金类箔膜;熔炼、烧结、溅射、涂覆、涂布层，电阻式、电容式触屏薄膜;电极涂料，其他半导体材料、薄膜材料方阻测试covering film;Conductive polymer film. high and low temperature electric film;Insulation. anti-radiation conductive film (shielding) cloth. decorative film. decorative paper.Metallized labels and alloy foil films. Smelting. sintering. sputtering. coating. coating. resistive. Capacitive touch screen.Electrode coating. other semiconductor materials. thin-film material resistance testing.
硅晶块、晶片电阻率及扩散层、外延层、ITO导电箔膜、导电橡胶等材料方块电阻 半导体材料/晶圆、太阳能电池、电子元器件，导电薄膜（ITO导电膜玻璃等），金属膜，导电漆膜，蒸发铝膜，PCB铜箔膜，EMI涂层等物质的薄层电阻与电阻率 导电性油漆，导电性糊状物，导电性塑料，导电性橡胶，导电性薄膜，金属薄膜， EMI 防护材料，导电性纤维，导电性陶瓷等.
Silicon block. chip resistance rate and diffusion 三.参数资料Parameters： 规格型号model FT-371A FT-371B FT-371C 1.方块电阻范围sheet resistance 10-4～1×107Ω/□ 10-4～1×109Ω/□ 10-4～1×1010Ω/□ 2.电阻率范围resistivity 10-5～2×108Ω-cm 10-5～2×1010Ω-cm 10-5～2×1011Ω-cm 3.测试电流范围test current 10mA ---200pA 10mA ---20pA 10mA ---2pA 4.电流精度current accuracy ±2% ±2% ±5% 5.电阻精度resistance accuracy ≤10% ≤10% ≤15% 6.显示读数display 液晶显示：电阻、电阻率、方阻、温度、单位换算、温度系数、电流、电压、探针形状、探针间距、厚度 、电导率 LCD: Resistance. resistivity. sheet resistance. temperature. unit conversion.temperature coefficient. current. voltage. probe shape. probe spacing. thickness. conductivity 7.测试方式test mode 组合双电测试方法combined double electric test method 8.工作电源working power 输入: AC 220V±10%.50Hz功 耗：<30w> 9.误差errors Machine uncertain≤15% 10.选购功能choose to buy 选购1.pc软件； 选购2.方形探头； 选购3.直线形探头； 选购4.测试平台1.pc software; 2. square probe; 3. linear probe; 4. test platform 11.测试探头test probe 探针间距选购： 2mm；3mm两种规格; 探针材质选购：碳化钨针、镀金磷铜半球形针Optional probe spacing: 1mm；2mm；3mm in three sizes.Select probe material: tungsten carbide needle. white steel needle. gilded copper hemispherical needles.
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